| 标题 |
Novel Focused Ion Beam Techniques for Enhanced Sample Preparation for In Situ Transmission Electron Microscopy Heating and Irradiation Experiments |
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| DOI | |
| 其它 |
期刊:Microscopy and Microanalysis 作者:Kerui Wei; Matthew Lindley; Xuzhao Liu; Sarah J Haigh; Ping Xiao; et al 出版日期:2025 |
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(2025-6-4)