| 标题 |
Few-shot fault identification of complex equipment via metric-based features capture GAN combining prior knowledge-augmented strategy |
| 网址 | |
| DOI | |
| 其它 |
期刊:Journal of Manufacturing Systems 作者:Shusen Dou; Fudong Li; Yuanhong Chang; Jinglong Chen; Weiguang Zheng; Aimin Li 出版日期:2023 |
| 求助人 | |
| 下载 |
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(2025-6-4)