| 标题 |
Nondestructive measurement of terahertz optical thin films by machine learning based on physical consistency |
| 网址 | |
| DOI |
10.1364/oe.521609
doi
|
| 其它 |
期刊:Optics Express 作者:Ziwei Ming; Defeng Liu; Long Xiao; Le Yang; Yuehuan Cheng; et al 出版日期:2024-04-08 |
| 求助人 | |
| 下载 | 求助已完成,仅限求助人或该文件上传人下载。 |
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(2025-6-4)