| 标题 |
Performance analysis of avionics devices based on electro-thermal-stress multi-physics coupling under immersion cooling |
| 网址 | |
| DOI | |
| 其它 |
期刊:Microelectronics Reliability 作者:Wenliang Qi 出版日期:2023-06-18 |
| 求助人 | |
| 下载 |
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(2025-6-4)