| 标题 |
TiO x electrode interface modification layer promises the prominent electrical/macroscopic properties of the metallized dielectric films |
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| DOI | |
| 其它 |
期刊:RSC Advances 作者:Qi Dong; Haolin Li; Zhongming Zhu; Depeng Kong; Shao‐Long Zhong; et al 出版日期:2025-01-01 |
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(2025-6-4)