| 标题 |
The degradation mechanism of the reach-through silicon avalanche photodiode by 1.7 MeV electron irradiation |
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| DOI | |
| 其它 |
期刊:Nuclear Instruments and Methods in Physics Reseach B 作者:Yun Li; Shu-Fan Cheng; Wuxian Zeng; Yao Ma; Mingmin Huang; et al 出版日期:2026-01-01 |
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(2025-6-4)