| 标题 |
Study of hafnium defects in silicon dioxide using density functional theory |
| 网址 | |
| DOI |
10.1016/j.mssp.2024.108202
doi
|
| 其它 |
期刊:Materials Science in Semiconductor Processing 作者:Diana Denice; A. Arya; Manoj Kumar; Gopika Vinod 出版日期:2024-02-07 |
| 求助人 | |
| 下载 | 暂无链接,等待应助者上传 |