| 标题 |
Impact of Interface Trap Charges on the Performance and Reliability of Heterojunction Hetero Dielectric Vertical Non-Uniform Channel Double Gate TFET |
| 网址 | |
| DOI | |
| 其它 |
期刊:ECS Journal of Solid State Science and Technology 作者:Swaroop Kumar Macherla; Ekta Goel 出版日期:2025-01-28 |
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