| 标题 |
 Sources of Dark Current in Backscattered Electron Detectors and a Novel Multiple Guard Ring Design to Lower It |
| 网址 | |
| DOI | |
| 其它 |
期刊：2024 Conference of Science and Technology for Integrated Circuits (CSTIC) 作者：Tao Wang; Yuanjun Guan; Jiayi Wang; Qianchuan Yi; Li Zhang; et al 出版日期：2024 |
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(2025-6-4)
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