| 标题 |
专利、报告等 A Method for Measuring and Correcting Errors in the Thickness of Semiconductor Thin Films Based on Reflection Spectroscopy Fitting Technology |
| 网址 | |
| DOI |
10.2139/ssrn.4585254
doi
|
| 其它 |
期刊:Elsevier BV 作者:Jiaxing Sun; Zhisong Li; Haojie Zhang; Jinlong Song 出版日期:2023-01-01 |
| 求助人 | |
| 下载 | 该求助完结已超 24 小时,文件已从服务器自动删除,无法下载。 |
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(2025-6-4)