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Measuring Technological Distance for Patent Mapping: A Comparison of Jaccard, Cosine, and Novel Hybrid Indicators |
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标题: Measuring Technological Distance for Patent Mapping: A Comparison of Jaccard, Cosine, and Novel Hybrid Indicators 作者: Zhang, Y., Chen, Y., & Wang, X. 期刊: Scientometrics(2022) DOI: 10.1007/s11192-022-04306-w |
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(2025-6-4)