| 标题 |
Reliability of Low-Parasitic-Capacitance Multilevel Interconnection Using Surface-Densified Low-ε Organic Spin-on Glass |
| 网址 | |
| DOI |
10.7567/ssdm.1996.a-5-5
doi
|
| 其它 |
期刊:Extended Abstracts of the 1996 International Conference on Solid State Devices and Materials 作者:Takeshi FURUSAWA; Yoshio HOMMA 出版日期:1996-08-27 |
| 求助人 | |
| 下载 | 求助已完成,仅限求助人或该文件上传人下载。 |
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