| 标题 |
 Characterization of the “native” surface thin film on pure polycrystalline iron: A high resolution XPS and TEM study |
| 网址 | |
| DOI | |
| 其它 |
期刊：Applied Surface Science 作者：G. Bhargava; I. Gouzman; C.M. Chun; T.A. Ramanarayanan; S.L. Bernasek 出版日期：2007 |
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