| 标题 |
A novel deep P-base contact 4H-SiC trench MOSFET with enhanced short circuit robustness |
| 网址 | |
| DOI | |
| 其它 |
期刊:Microelectronics Journal 作者:Rashid Jamal; P. Gupta; Hafizur Rahaman 出版日期:2026-10-01 |
| 求助人 | |
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(2025-6-4)