| 标题 |
Beyond Academic Benchmarks: Critical Analysis and Best Practices for Visual Industrial Anomaly Detection |
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期刊:2025 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) 作者:Aimira Baitieva; Yacine Bouaouni; A. Briot; Dick Ameln; Souhaiel Khalfaoui; et al 出版日期:2025-03-30 |
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(2025-6-4)