| 标题 |
Deep expert network: A unified method toward knowledge-informed fault diagnosis via fully interpretable neuro-symbolic AI |
| 网址 | |
| DOI | |
| 其它 |
期刊:Journal of Manufacturing Systems 作者:Qi Li; Yuekai Liu; Shilin Sun; Zhaoye Qin; Fulei Chu 出版日期:2024-10-25 |
| 求助人 | |
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(2025-6-4)