| 标题 |
Insights into oxygen vacancy dynamics in HfO2–ZrO2 superlattice ferroelectric films: Implications for device reliability |
| 网址 | |
| DOI | |
| 其它 |
期刊:Journal of Applied Physics 作者:Maokun Wu; Boyao Cui; Xuepei Wang; Miaojia Yuan; Yishan Wu; et al 出版日期:2024-10-08 |
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(2025-6-4)