| 标题 |
A hybrid kernel-CNN approach for SEM-contour-based etch bias modeling in advanced semiconductor nodes |
| 网址 | |
| DOI | |
| 其它 |
期刊:Second International Conference on Optical Communication and Optoelectronic Technology (OCOT 2025) 作者:Cheng Qian; Chaoxin Feng; Ruoran Jia; Klimis Ntalianis 出版日期:2025 |
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(2025-6-4)