| 标题 |
TD‐YOLO: A Lightweight Detection Algorithm for Tiny Defects in High‐Resolution PCBs |
| 网址 | |
| DOI | |
| 其它 |
期刊:Advanced Theory and Simulations 作者:Qin Ling; Nor Ashidi Mat Isa 出版日期:2023-12-23 |
| 求助人 | |
| 下载 | 求助已完成,仅限求助人下载。 |
PDF的下载单位、IP信息已删除
(2025-6-4)