| 标题 |
In‐Device Ballistic‐Electron‐Emission Spectroscopy for Accurately In Situ Mapping Energy Level Alignment at Metal–Organic Semiconductors Interface |
| 网址 | |
| DOI | |
| 其它 |
期刊:Advanced Materials 作者:Ke Meng; Ruiheng Zheng; Xianrong Gu; Rui Zhang; Lidan Guo; et al 出版日期:2024-11-11 |
| 求助人 | |
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(2025-6-4)