| 标题 |
Charge trapping, hydrogen accumulation, and structural rearrangement: A complete model for ultraviolet-induced degradation in TOPCon devices |
| 网址 | |
| DOI | |
| 其它 |
期刊:Solar Energy Materials and Solar Cells 作者:Muhammad Umair Khan; Alison Ciesla; Aeron Johns; Chandany Sen; Ting Huang; et al 出版日期:2026 |
| 求助人 | |
| 下载 |
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(2025-6-4)