| 标题 |
Charge-pumping characterization of SiO/sub 2//Si interface in virgin and irradiated power VDMOSFETs |
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| DOI | |
| 其它 |
期刊:IEEE Transactions on Electron Devices 作者:P. Habas; Z. Prijic; D. Pantic; N.D. Stojadinovic 出版日期:1996-01-01 |
| 求助人 | |
| 下载 |
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(2025-6-4)