| 标题 |
In situ Atomic-Scale Imaging Unveils Clamping-Enhanced Strain and Phase Transition Pathways in Antiferroelectric Thin Films |
| 网址 | |
| DOI | |
| 其它 |
期刊:Microscopy and Microanalysis 作者:Menglin Zhu; Michael Xu; Hao Pan; Colin Gilgenbach; Lane W Martin; James M LeBeau 出版日期:2025-07-25 |
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(2025-6-4)