| 标题 |
Bayesian estimation analysis of X-ray photoelectron spectra: Application to Si 2p spectrum analysis of oxidized silicon surfaces |
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| DOI | |
| 其它 |
期刊:Applied Surface Science 作者:Hiroshi Shinotsuka; Kenji Nagata; Hideki Yoshikawa; Shuichi Ogawa; Akitaka Yoshigoe 出版日期:2025 |
| 求助人 | |
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(2025-6-4)