| 标题 |
Fine Mapping of the All‐Stage Stripe Rust Resistance Gene Yr4EL and Its Utilization in Wheat Resistance Breeding |
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| DOI | |
| 其它 |
期刊:Plant, Cell & Environment 作者:Biran Gong; Hao Zhang; Yuxing Lu; Linfeng Chen; Wei Zhu; et al 出版日期:2025 |
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| 下载 |