| 标题 |
Statistical Degradation in BGAs for Early Fault Detection |
| 网址 | |
| DOI | |
| 其它 |
期刊:ISTFA 2024: Conference Proceedings from the 50th International Symposium for Testing and Failure Analysis 作者:Emmanuel Bender; Tsuriel Avraham; Joseph B. Bernstein; Duane S. Boning 出版日期:2024 |
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(2025-6-4)