| 标题 |
Noble Infrared Optical Thickness Monitoring System Based on the Algorithm of Phase-Locked Output Current–Reflectivity Coefficient |
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| DOI | |
| 其它 |
期刊:Coatings 作者:Suotao Dong; Xiuhua Fu; Cheng Li 出版日期:2022-06-06 |
| 求助人 | |
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(2025-6-4)