| 标题 |
Degradation Modeling And Residual Life Prediction Of Electronic Devices Based On Wiener Process
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Wang Tingyun, Li Zhigang, Zuo Shuai et al.,Degradation Modeling And Residual Life Prediction Of Electronic Devices Based On Wiener Process. Proceedings of ICREPEC 2014. 2014(38):378-382. Wenzhou, China. |
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