| 标题 |
Reliability Issues of Thin Film Transistors Subject to Electrostatic Discharge Stresses: An Overview (Adv. Electron. Mater. 2/2022) |
| 网址 | |
| DOI | |
| 其它 |
期刊:Advanced Electronic Materials 作者:Yan Yan; Wenrui Lan; Yuankang Chen; Dongbu Yang; Ye Zhou; et al 出版日期:2022 |
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(2025-6-4)