| 标题 |
Uncertainty Quantification of Silicon Anode Capacity Fading with Multiple Interactive Degradation Mechanisms Using Physics-Informed Gaussian Process Modeling |
| 网址 | |
| DOI | |
| 其它 |
期刊:Journal of The Electrochemical Society 作者:Parth Bansal; Peilin Lu; Paul Braun; Yumeng Li; Pingfeng Wang 出版日期:2025-10-01 |
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(2025-6-4)