| 标题 |
The effect of materials and design on the reliability of through-glass vias for 2.5 D integrated circuits: a numerical study |
| 网址 | |
| DOI | |
| 其它 |
期刊:Multidiscipline Modeling in Materials and Structures 作者:Omar Ahmed; Chukwudi Okoro; Scott Pollard; Tengfei Jiang 出版日期:2020-09-08 |
| 求助人 | |
| 下载 | 该求助完结已超 24 小时,文件已从服务器自动删除,无法下载。 |
PDF的下载单位、IP信息已删除
(2025-6-4)