| 标题 |
Defect passivation and interface smoothing by N2O plasma for enhanced mobility and stability in vertical channel oxide TFTs |
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| DOI | |
| 其它 |
期刊:Materials Science in Semiconductor Processing 作者:Wei Sun; Cong Peng; Fa-Hsyang Chen; Guowen Yan; Lin Xu; et al 出版日期:2026-11-01 |
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(2025-6-4)