| 标题 |
Simulation Study: The Impact of Structural Variations on the Characteristics of a Buried-Channel-Array Transistor (BCAT) in DRAM |
| 网址 | |
| DOI |
10.3390/mi13091476
doi
|
| 其它 |
期刊:Micromachines 作者:Minjae Sun; Hyoung Won Baac; Changhwan Shin 出版日期:2022-09-05 |
| 求助人 | |
| 下载 | 求助已完成,仅限求助人下载。 |