| 标题 |
Fitting Model-Based Dark Current Analysis for Normal and Inverted Quantum Dot Photodiodes |
| 网址 | |
| DOI | |
| 其它 |
期刊:International Conference on Electronic Materials and Packaging 作者:Kai-Yu Luo; Yi-Xin Zheng; Hao-Dong Tang 出版日期:2025-08-08 |
| 求助人 | |
| 下载 | 求助已完成,仅限求助人或该文件上传人下载。 |
PDF的下载单位、IP信息已删除
(2025-6-4)