| 标题 |
How the concept of evanescent point sources contributes to the understanding of microsphere-assisted microscopy (Conference Presentation) 消逝点源的概念如何有助于理解微球辅助显微镜(会议演示)
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| DOI | |
| 其它 |
期刊:Optical Measurement Systems for Industrial Inspection XIV 作者:Sylvain Lecler; Rayenne Boudoukha; Stéphane Perrin; Assia Guessoum; Nacer E. Demagh; et al 出版日期:2025 |
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(2025-6-4)