| 标题 |
Extraction of Electromechanical Coefficients from Capacitance–Voltage Measurements of Unannealed Solution‐Processed KNN Thin Films: Effects of Frequency and Electrostatic and Mechanical Deformation |
| 网址 | |
| DOI | |
| 其它 |
期刊:physica status solidi (a) 作者:Rajinder Singh Deol; Nitika Batra; Kritika Bhattacharya; Henam Sylvia Devi; Bhaskar Mitra; Madhusudan Singh 出版日期:2022 |
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(2025-6-4)