| 标题 |
Simultaneous precise measurements of multiple surfaces in wavelength-tuning interferometry via parameter estimation |
| 网址 | |
| DOI | |
| 其它 |
期刊:Advances in Manufacturing 作者:Yong-Hao Zhou; Bin Shen; Lin Chang; Sergiy Valyukh; Ying-Jie Yu 出版日期:2025 |
| 求助人 | |
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