| 标题 |
[高分]
Competing self-trapped hole release and deep-level defect recombination in Ga2O3 photodetectors |
| 网址 | |
| DOI | |
| 其它 |
期刊:Applied Physics Letters 作者:Shuaihang Xu; Qingxuan Sun; Jiahao Liao; Changjie Zhou; Huili Zhu; et al 出版日期:2026-10-05 |
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(2025-6-4)