| 标题 |
Automated Detection and Localization of Counterfeit Chip Defects by Texture Analysis in Infrared (IR) Domain |
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| DOI | |
| 其它 |
期刊:2020 IEEE Physical Assurance and Inspection of Electronics (PAINE) 作者:Pallabi Ghosh; Ulbert J Botero; Fatemeh Ganji; Damon Woodard; Rajat Subhra Chakraborty; Domenic Forte 出版日期:2021-02-04 |
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(2025-6-4)