| 标题 |
Apparent and steady-state etch rates in thin film etching and under-etching of microstructures: II. Characterization |
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| DOI | |
| 其它 |
期刊:Journal of Micromechanics and Microengineering 作者:Gregory Van Barel; Bert Du Bois; Rita Van Hoof; Jef De Wachter; Ward De Ceuninck; et al 出版日期:2010-04-29 |
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(2025-6-4)