| 标题 |
A spectrophotometric method for the characterisation of thin metallic layers and validation in the example case of titanium |
| 网址 | |
| DOI | |
| 其它 |
期刊:Advances in Optical Thin Films VII 作者:Riley Shurvinton; Julien Lumeau; Fabien Lemarchand; Antonin Moreau 出版日期:2021-09-09 |
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(2025-6-4)