| 标题 |
A simplified method to predict fatigue damage of TTR subjected to short-term VIV using artificial neural network |
| 网址 | |
| DOI | |
| 其它 |
期刊:Advances in Engineering Software 作者:E. Wong; Do Kyun Kim 出版日期:2018-12-01 |
| 求助人 | |
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(2025-6-4)