硫化
材料科学
有色的
发光二极管
复合材料
硫化物
法律工程学
天然橡胶
工程类
冶金
光电子学
作者
Yinle Li,Huanxiang Xu,Hao Zhao,Zilian Liu,Yanhuang Tang,Zhenbo Zhao,Peijiang Liu,Yan Ren
标识
DOI:10.1016/j.microrel.2023.115183
摘要
Light-emitting diodes (LED) failure can be attributed to various factors such as vulcanization, which is considered as one of the primary causes. The main consequence of vulcanization is the production of black silver sulfide, a result of silver and sulfur ion interaction within the plating layer. The consequences of this reaction can be quite severe, leading to a reduction in luminous flux, color temperature drift, golden ball and support fracture. In this work, following an analysis of the process structure characteristics of LED support, four vulcanization failure paths have been identified. To determine the main vulcanization path of the LED stent, various tests, such as the vulcanization corrosion test, the red ink test, and the cross-section test, have been conducted. This work provides an innovative and constructive approach for directing failure research in LED package.
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