计算机科学
人工智能
自动化
深度学习
交叉口(航空)
棱锥(几何)
光学(聚焦)
机器学习
模式识别(心理学)
计算机视觉
工程类
机械工程
光学
物理
航空航天工程
作者
Chenxukun Lou,Lawrence Tinsley,Fabian Duarte Martinez,Simon Gray,Barmak Honarvar Shakibaei Asli
出处
期刊:Electronics
[MDPI AG]
日期:2024-12-06
卷期号:13 (23): 4824-4824
被引量:2
标识
DOI:10.3390/electronics13234824
摘要
Detecting structural cracks is critical for quality control and maintenance of industrial materials, ensuring their safety and extending service life. This study enhances the automation and accuracy of crack detection in microscopic images using advanced image processing and deep learning techniques, particularly the YOLOv8 model. A comprehensive review of relevant literature was carried out to compare traditional image-processing methods with modern machine-learning approaches. The YOLOv8 model was optimized by incorporating the Wise Intersection over Union (WIoU) loss function and the bidirectional feature pyramid network (BiFPN) technique, achieving precise detection results with mean average precision (mAP@0.5) of 0.895 and a precision rate of 0.859, demonstrating its superiority in detecting fine cracks even in complex and noisy backgrounds. Experimental findings confirmed the model’s high accuracy in identifying cracks, even under challenging conditions. Despite these advancements, detecting very small or overlapping cracks in complex backgrounds remains challenging. Our future work will focus on optimizing and extending the model’s generalisation capabilities. The findings of this study provide a solid foundation for automatic and rapid crack detection in industrial applications and indicate potential for broader applications across various fields.
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