光电探测器
材料科学
肖特基二极管
肖特基势垒
光电子学
异质结
电接点
电极
基质(水族馆)
超短脉冲
激光器
光学
二极管
化学
物理
地质学
物理化学
海洋学
作者
Jian Li,Zhihao Wang,Jialing Jian,Zhengjin Weng,Qianqian Wu,Xingyu Zhou,Liangliang Lin,Xiaofeng Gu,Peng Xiao,Haiyan Nan,Shaoqing Xiao
标识
DOI:10.1002/advs.202510373
摘要
Abstract Conventional top‐contact two dimensional (2D) Schottky photodetectors suffer from light shadowing and contact damage, leading to Fermi‐level pinning and performance degradation. This work overcomes these limitations by designing a bottom‐electrode Schottky photodetector (BE‐Schottky PD) based on a Cr/WSe 2 /Au heterostructure. The key innovation involves fabricating the bottom Schottky Cr electrode into pre‐etched SiO 2 substrate trenches, making it flush with the surface. This unique geometry eliminates optical shadowing to maximize light absorption, and enables a high‐quality van der Waals Cr/WSe 2 interface, mitigating Fermi‐level pinning. Consequently, the device exhibits an outstanding rectification ratio of 1.07 × 10 4 and an ideality factor of 1.11 due to the strong built‐in electric field. It demonstrates excellent self‐powered operation within the visible spectrum. Under 532 nm laser illumination and zero bias, it achieves rapid photoresponse with a fall time of 3.8 µs. This work, utilizing industry‐compatible metals and a simple process, realizes a high‐performance photodetector, highlighting the significant potential of 2D materials for efficient, low‐power, and ultrasensitive optoelectronics.
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