Challenges in FIB TEM Sample Preparation: Damage Issues and Solutions

Journal Article Challenges in FIB TEM Sample Preparation: Damage Issues and Solutions Get access Xiangli Zhong, Xiangli Zhong Department of Materials, University of Manchester Corresponding author: xl.zhong@manchester.ac.uk Search for other works by this author on: Oxford Academic Google Scholar Xiaorong Zhou, Xiaorong Zhou Department of Materials, University of Manchester Search for other works by this author on: Oxford Academic Google Scholar Sarah J Haigh, Sarah J Haigh Department of Materials, University of Manchester Search for other works by this author on: Oxford Academic Google Scholar Philip J Withers, Philip J Withers Department of Materials, University of Manchester Search for other works by this author on: Oxford Academic Google Scholar M Grace Burke M Grace Burke Oak Ridge National Laboratory Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 28, Issue S1, 1 August 2022, Pages 60–62, https://doi.org/10.1017/S1431927622001155 Published: 01 August 2022