蚀刻(微加工)
材料科学
氧化剂
溶解
钼
表面光洁度
氧化物
氨
过氧化物
表面粗糙度
化学工程
无机化学
纳米技术
冶金
复合材料
图层(电子)
化学
有机化学
工程类
作者
Antoine Pacco,Yuya Akanishi,Quoc Toan Le
出处
期刊:Solid State Phenomena
日期:2021-02-01
卷期号:314: 295-301
被引量:8
标识
DOI:10.4028/www.scientific.net/ssp.314.295
摘要
In this work the wet etching of molybdenum thin films was investigated for applications requiring controlled recess without roughening or pattern loading. First, continuous etching of Mo in alkaline and oxidative peroxide solutions was studied. Then, additives like glycine and diethylenetriamine were used and their effect on etch rate and roughness was assessed. Finally, we evaluated if the requirements for a stepwise etching approach for Mo recess using peroxide or ozonated water as the oxidizing step and ammonia as the oxide dissolution agent were met.
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