In situ tracking anisotropic photocarrier dynamics in two-dimensional ternary Ta2NiSe5 via digital micromirror device-based pump-probe microscopy

In two-dimensional (2D) material studies, tracking the anisotropic ultrafast carrier dynamics is essential for the development of optoelectronic nano-devices. Conventionally, the anisotropic optical and electronic properties are investigated via either polarization-dependent Raman spectroscopy or field-effect transistors measurements. However, study of the anisotropic transient carrier behaviors is still challenging, due largely to the lack of picosecond-resolved acquisition or programmable scanning capabilities in the current characterization systems. In this work, we select Ta 2 NiSe 5 as a model system to investigate the ultrafast anisotropic transportation properties of photo-excited carriers and transient polarized responses via a digital micromirror device (DMD)-based pump-probe microscope, where the probe beam scans along the armchair and zigzag directions of a crystal structure via binary holography to obtain distinct carrier diffusion coefficients, respectively. The results reveal the nonlinear diffusion behaviors of Ta 2 NiSe 5 in tens of picoseconds, which are attributed to the interplay between excited electrons and phonons. The trend of the measured local polarization-dependent transient reflectivity is consistent with the polarized Raman spectra results. These results show that the DMD-based pump-probe microscope is an effective and versatile tool to study the optoelectronic properties of 2D materials.