显微镜
电子显微镜
透射电子显微镜
低压电子显微镜
常规透射电子显微镜
显微镜
高分辨率透射电子显微镜
加速电压
电子断层摄影术
扫描电子显微镜
扫描透射电子显微镜
材料科学
分辨率(逻辑)
光学显微镜
光学
电子
纳米技术
物理
计算机科学
阴极射线
人工智能
量子力学
作者
Lars Möller,Gudrun Holland,Michael Laue
标识
DOI:10.1369/0022155420929438
摘要
Diagnostic electron microscopy is a useful technique for the identification of viruses associated with human, animal, or plant diseases. The size of virus structures requires a high optical resolution (i.e., about 1 nm), which, for a long time, was only provided by transmission electron microscopes operated at 60 kV and above. During the last decade, low-voltage electron microscopy has been improved and potentially provides an alternative to the use of high-voltage electron microscopy for diagnostic electron microscopy of viruses. Therefore, we have compared the imaging capabilities of three low-voltage electron microscopes, a scanning electron microscope equipped with a scanning transmission detector and two low-voltage transmission electron microscopes, operated at 25 kV, with the imaging capabilities of a high-voltage transmission electron microscope using different viruses in samples prepared by negative staining and ultrathin sectioning. All of the microscopes provided sufficient optical resolution for a recognition of the viruses tested. In ultrathin sections, ultrastructural details of virus genesis could be revealed. Speed of imaging was fast enough to allow rapid screening of diagnostic samples at a reasonable throughput. In summary, the results suggest that low-voltage microscopes are a suitable alternative to high-voltage transmission electron microscopes for diagnostic electron microscopy of viruses.
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