正电子湮没谱学
纳米材料
表征(材料科学)
多普勒展宽
正电子湮没
材料科学
纳米技术
光谱学
消灭
正电子
核物理学
物理
量子力学
天文
谱线
电子
作者
Ann Rose Abraham,P.M.G. Nambissan
出处
期刊:Elsevier eBooks
[Elsevier]
日期:2022-01-01
卷期号:: 123-146
被引量:2
标识
DOI:10.1016/b978-0-12-820558-7.00016-9
摘要
Positron annihilation spectroscopy (PAS) is a highly sensitive and promising method of probing the structural defects in solids including nanomaterials. PAS studies are carried out to obtain information related to the structural defects in materials for the investigation of their suitability of application in various fields of science, technology, and materials engineering. The chapter describes a comprehensive, systematic, and methodical elucidation of fundamentals of positron annihilation lifetime and coincidence Doppler broadening spectroscopic techniques. The chapter explains in detail how PAS is effectively utilized to investigate in detail the changes in structure and structural defects like vacancies and thereby to probe the related properties. The chapter covers the essential gamut of PAS in nanomaterials and serves as a comprehensive reference material for this subject.
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